Facts
유량 센서의 접액부가 산성 케미컬에 노출이 되면 미세 금속이 침출될 수 있습니다. 미세 금속 오염은 반도체 장치의 전기적 특성에 영향을 줄 수 있습니다.
Test Conditions
유량 센서 LFS-20과 LFS-80을 UPW로 채워준 후 사용된 UPW의 모든 금속, 반응성 실리카 및 음이온 분순물의 수준을 측정했습니다.
Results
두 센서 모두 F40/F57 기준 내의 측정 레벨을 보였습니다.
AuthorM. Reutz, R. Braitmayer
CompanyATU GmbH
Document Number0910 066
Pages3
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